Guo L, Leobandung E, Chou SY
Nanostructure Laboratory, Department of Electrical Engineering, University of Minnesota, Minneapolis, MN 55455, USA.
Science. 1997 Jan 31;275(5300):649-51. doi: 10.1126/science.275.5300.649.
A single-electron memory, in which a bit of information is stored by one electron, is demonstrated at room temperature. The memory is a floating gate metal-oxide-semiconductor transistor in silicon with a channel width ( approximately 10 nanometers) smaller than the Debye screening length of a single electron and a nanoscale polysilicon dot ( approximately 7 nanometers by 7 nanometers) as the floating gate embedded between the channel and the control gate. Storing one electron on the floating gate screens the entire channel from the potential on the control gate and leads to (i) a discrete shift in the threshold voltage, (ii) a staircase relation between the charging voltage and the shift, and (iii) a self-limiting charging process. The structure and fabrication of the memory should be compatible with future ultralarge-scale integrated circuits.
一种单电子存储器在室温下得到了演示,其中一位信息由一个电子存储。该存储器是硅中的浮栅金属氧化物半导体晶体管,其沟道宽度(约10纳米)小于单个电子的德拜屏蔽长度,并且有一个纳米级多晶硅点(约7纳米×7纳米)作为嵌入在沟道和控制栅之间的浮栅。在浮栅上存储一个电子会使整个沟道免受控制栅上电势的影响,并导致:(i)阈值电压的离散偏移;(ii)充电电压与偏移之间的阶梯关系;以及(iii)自限性充电过程。该存储器的结构和制造应与未来的超大规模集成电路兼容。