Wall M A, Barbee T W, Weihs T P
Chemistry and Materials Science Department, Lawrence Livermore National Laboratory, Livermore, California 94550, USA.
Microsc Res Tech. 1997 Feb 1;36(3):143-50. doi: 10.1002/(SICI)1097-0029(19970201)36:3<143::AID-JEMT1>3.0.CO;2-Q.
The success of in situ transmission electron microscopy experimentation is often dictated by proper specimen preparation and sample design procedures. We have developed a novel technique permitting the production of tensile specimens of multilayered films in cross-section for in situ deformation studies. Of primary, importance in the development of this technique is the production of an electron transparent micro-gauge section. This micro-gauge section predetermines the position at which plastic deformation, crack nucleation and growth, and failure are observed. In short, we report in detail, a unique combination of specimen preparation procedural steps and the design of a multilayer foil sample. The ability of these procedures to facilitate the success of in situ TEM tensile studies of layered materials in cross-section is demonstrated using a Cu-Zr multilayer foil.
原位透射电子显微镜实验的成功往往取决于适当的样品制备和样品设计程序。我们开发了一种新技术，能够制备多层薄膜横截面的拉伸试样，用于原位变形研究。在这项技术的开发中，最重要的是制备一个电子透明的微尺度区域。这个微尺度区域预先确定了观察塑性变形、裂纹形核与扩展以及失效的位置。简而言之，我们详细报告了样品制备程序步骤与多层箔片样品设计的独特组合。使用铜锆多层箔片证明了这些程序有助于成功进行层状材料横截面的原位透射电镜拉伸研究。
