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通过原子力显微镜对抗体-抗原相互作用进行高度和粘附力同步成像。

Simultaneous height and adhesion imaging of antibody-antigen interactions by atomic force microscopy.

作者信息

Willemsen O H, Snel M M, van der Werf K O, de Grooth B G, Greve J, Hinterdorfer P, Gruber H J, Schindler H, van Kooyk Y, Figdor C G

机构信息

Department of Applied Physics, Applied Optics Group, University of Twente, Enschede, The Netherlands.

出版信息

Biophys J. 1998 Nov;75(5):2220-8. doi: 10.1016/S0006-3495(98)77666-0.

Abstract

Specific molecular recognition events, detected by atomic force microscopy (AFM), so far lack the detailed topographical information that is usually observed in AFM. We have modified our AFM such that, in combination with a recently developed method to measure antibody-antigen recognition on the single molecular level (Hinterdorfer, P., W. Baumgartner, H. J. Gruber, K. Schilcher, and H. Schindler, Proc. Natl. Acad. Sci. USA 93:3477-3481 (1996)), it allows imaging of a submonolayer of intercellular adhesion molecule-1 (ICAM-1) in adhesion mode. We demonstrate that for the first time the resolution of the topographical image in adhesion mode is only limited by tip convolution and thus comparable to tapping mode images. This is demonstrated by imaging of individual ICAM-1 antigens in both the tapping mode and the adhesion mode. The contrast in the adhesion image that was measured simultaneously with the topography is caused by recognition between individual antibody-antigen pairs. By comparing the high-resolution height image with the adhesion image, it is possible to show that specific molecular recognition is highly correlated with topography. The stability of the improved microscope enabled imaging with forces as low as 100 pN and ultrafast scan speed of 22 force curves per second. The analysis of force curves showed that reproducible unbinding events on subsequent scan lines could be measured.

摘要

目前,通过原子力显微镜(AFM)检测到的特定分子识别事件缺乏通常在AFM中观察到的详细形貌信息。我们对AFM进行了改进,使其与最近开发的在单分子水平上测量抗体 - 抗原识别的方法(Hinterdorfer, P., W. Baumgartner, H. J. Gruber, K. Schilcher, and H. Schindler, Proc. Natl. Acad. Sci. USA 93:3477 - 3481 (1996))相结合,能够以粘附模式对细胞间粘附分子-1(ICAM-1)的亚单层进行成像。我们首次证明,在粘附模式下形貌图像的分辨率仅受针尖卷积限制,因此与轻敲模式图像相当。这通过在轻敲模式和粘附模式下对单个ICAM-1抗原进行成像得以证明。与形貌同时测量的粘附图像中的对比度是由单个抗体 - 抗原对之间的识别引起的。通过将高分辨率高度图像与粘附图像进行比较,可以表明特定分子识别与形貌高度相关。改进后的显微镜稳定性使得能够在低至100 pN的力下成像,并实现每秒22条力曲线的超快扫描速度。对力曲线的分析表明,可以测量后续扫描线上可重复的解离事件。

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本文引用的文献

1
Atomic force microscope.原子力显微镜
Phys Rev Lett. 1986 Mar 3;56(9):930-933. doi: 10.1103/PhysRevLett.56.930.

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