Mills J B, Vacano E, Hagerman P J
Department of Biochemistry and Molecular Genetics, University of Colorado Health Sciences Center, 4200 East Ninth Avenue, Denver, CO, 80262, USA.
J Mol Biol. 1999 Jan 8;285(1):245-57. doi: 10.1006/jmbi.1998.2287.
The forces responsible for the formation and stabilization of secondary and higher-order nucleic acid structure can be more fully understood once the sequence-dependent properties (e.g. intrinsic rigidity, effective rise) of the component single-stranded species are well-defined. Knowledge of the conformations of the single-stranded polymers is also important for the development of better polyelectrolyte models for various structural or strand-dissociation reactions. However, there is at present little quantitative information regarding the sequence dependence of either rise or rigidity in single-stranded DNA or RNA polymers. To address this issue, we describe a form of transient electric birefringence (TEB) measurement in which the rotational decay times (taugap) of DNA molecules possessing central, single-stranded regions (gaps) are compared with the corresponding times (taudplx) for duplex control molecules of the same length (in nucleotides per strand) as the continuous strand in the "gapped duplex". For magnesium ion concentrations above 1-2 mM, the tau ratios ( identical withtaugap/taudplx) for the gapped duplexes reach plateau values, above which no further change in tau ratio is observed; values for the persistence length (P) and internucleotide spacing (h) of the gap sequences are obtained from the experimental tau ratios. For dTn, the permissible ranges of P and h are 20-30 A and 5-7 A per nucleotide (nt), respectively, with optimal values of 31 A (P) and 5. 2 A/nt (h). For dAn, the persistence length for the low temperature (4 degreesC), stacked form is 78 (+/-8) A for a helix rise of 3.2 A/nt. One significant advantage of the current method over previous approaches is the use of short (80-100 nt) molecules, thus facilitating the production of various gap sequences through synthetic means.
一旦组成单链核酸的序列依赖性特性(如固有刚性、有效上升高度)得到充分明确,那么负责二级及更高级核酸结构形成与稳定的作用力就能得到更全面的理解。单链聚合物构象的知识对于开发用于各种结构或链解离反应的更好的聚电解质模型也很重要。然而,目前关于单链DNA或RNA聚合物中上升高度或刚性的序列依赖性的定量信息很少。为了解决这个问题,我们描述了一种瞬态电双折射(TEB)测量形式,其中将具有中央单链区域(缺口)的DNA分子的旋转衰减时间(taugap)与“缺口双链体”中连续链长度相同(每条链的核苷酸数)的双链对照分子的相应时间(taudplx)进行比较。对于镁离子浓度高于1 - 2 mM的情况,缺口双链体的tau比率(等于taugap/taudplx)达到平稳值,超过该值后tau比率不再有进一步变化;从实验得到的tau比率中获得缺口序列的持久长度(P)和核苷酸间距(h)的值。对于dTn,P和h的允许范围分别为每个核苷酸(nt)20 - 30 Å和5 - 7 Å,最佳值分别为31 Å(P)和5.2 Å/nt(h)。对于dAn,低温(4℃)下堆积形式的持久长度对于3.2 Å/nt的螺旋上升高度为78(±8)Å。当前方法相对于先前方法的一个显著优点是使用短(80 - 100 nt)分子,从而便于通过合成手段产生各种缺口序列。