砷化镓和砷化铟表面的氧化物：参考化合物和薄氧化层的X射线光电子能谱研究。 - Suppr

Oxides on GaAs and InAs surfaces: An x-ray-photoelectron-spectroscopy study of reference compounds and thin oxide layers.

作者信息

Hollinger G, Skheyta-Kabbani R, Gendry M

出版信息

Phys Rev B Condens Matter. 1994 Apr 15;49(16):11159-11167. doi: 10.1103/physrevb.49.11159.

DOI:10.1103/physrevb.49.11159

PMID:10009965

Abstract

摘要

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Oxides on GaAs and InAs surfaces: An x-ray-photoelectron-spectroscopy study of reference compounds and thin oxide layers.

Phys Rev B Condens Matter. 1994 Apr 15;49(16):11159-11167. doi: 10.1103/physrevb.49.11159.

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Oxides on GaAs and InAs surfaces: An x-ray-photoelectron-spectroscopy study of reference compounds and thin oxide layers.

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Oxides on GaAs and InAs surfaces: An x-ray-photoelectron-spectroscopy study of reference compounds and thin oxide layers.

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