Neil MA, Juskaitis R, Booth MJ, Wilson T, Tanaka T, Kawata S
Department of Engineering Science, University of Oxford, Parks Road, Oxford, OX1 3PJ, U.K., Department of Applied Physics, Osaka University, 2-1 Yamadaoka, Suita-City, Osaka 565-0871, Japan.
J Microsc. 2000 Nov;200 (Pt 2):105-8. doi: 10.1046/j.1365-2818.2000.00770.x.
We demonstrate aberration correction in two-photon microscopy. Specimen-induced aberrations were measured with a modal wavefront sensor, implemented using a ferro-electric liquid crystal spatial light modulator (FLCSLM). Wavefront correction was performed using the same FLCSLM. Axial scanned (xz) images of fluorescently labelled polystyrene beads using an oil immersion lens show restored sectioning ability at a depth of 28 &mgr;m in an aqueous specimen.
