Adaptive aberration correction in a two-photon microscope.

作者信息

Neil MA, Juskaitis R, Booth MJ, Wilson T, Tanaka T, Kawata S

机构信息

Department of Engineering Science, University of Oxford, Parks Road, Oxford, OX1 3PJ, U.K., Department of Applied Physics, Osaka University, 2-1 Yamadaoka, Suita-City, Osaka 565-0871, Japan.

出版信息

J Microsc. 2000 Nov;200 (Pt 2):105-8. doi: 10.1046/j.1365-2818.2000.00770.x.

DOI:10.1046/j.1365-2818.2000.00770.x

PMID:11106950

Abstract

We demonstrate aberration correction in two-photon microscopy. Specimen-induced aberrations were measured with a modal wavefront sensor, implemented using a ferro-electric liquid crystal spatial light modulator (FLCSLM). Wavefront correction was performed using the same FLCSLM. Axial scanned (xz) images of fluorescently labelled polystyrene beads using an oil immersion lens show restored sectioning ability at a depth of 28 &mgr;m in an aqueous specimen.

摘要