Diener J, Künzner N, Gross E, Kovalev D, Fujii M
Technische Universität München, Physik-Department E16, D-85747 Garching, Germany.
Opt Lett. 2004 Jan 15;29(2):195-7. doi: 10.1364/ol.29.000195.
Silicon-based thin-film polarizers operating in the visible and near-infraed spectral range are fabricated by electrochemical etching of bulk silicon wafers. Anisotropically etched (110) porous silicon layers exhibit a strong in-plane anisotropy of the refractive index. Stackes of alternating layers with different mean refractive indices and thicknesses act as dichroic Bragg reflectors or microcavities, respectively. Both structures have two distinct reflection and transmission bands depending on the polarization of the incident linearly polarized light. Planar polarizers are realized through the combination, in one structure, of a dichroic reflector with either a second reflector or a microcavity with different spectral responses.
在可见光和近红外光谱范围内工作的硅基薄膜偏振器是通过对体硅晶片进行电化学蚀刻来制造的。各向异性蚀刻的(110)多孔硅层表现出很强的面内折射率各向异性。具有不同平均折射率和厚度的交替层堆叠分别充当二向色性布拉格反射器或微腔。这两种结构都有两个不同的反射和透射带,这取决于入射线性偏振光的偏振。平面偏振器是通过在一种结构中将二向色性反射器与具有不同光谱响应的第二个反射器或微腔组合来实现的。