Fong Dillon D, Stephenson G Brian, Streiffer Stephen K, Eastman Jeffrey A, Auciello Orlando, Fuoss Paul H, Thompson Carol
Materials Science Division, Argonne National Laboratory, Argonne, IL 60439, USA.
Science. 2004 Jun 11;304(5677):1650-3. doi: 10.1126/science.1098252.
Understanding the suppression of ferroelectricity in perovskite thin films is a fundamental issue that has remained unresolved for decades. We report a synchrotron x-ray study of lead titanate as a function of temperature and film thickness for films as thin as a single unit cell. At room temperature, the ferroelectric phase is stable for thicknesses down to 3 unit cells (1.2 nanometers). Our results imply that no thickness limit is imposed on practical devices by an intrinsic ferroelectric size effect.
理解钙钛矿薄膜中铁电性的抑制是一个几十年来一直未得到解决的基本问题。我们报告了一项关于钛酸铅的同步加速器X射线研究,该研究将其作为温度和薄膜厚度(薄至单个晶胞)的函数。在室温下,铁电相对于低至3个晶胞(1.2纳米)的厚度是稳定的。我们的结果表明,实际器件不会受到本征铁电尺寸效应所带来的厚度限制。