Schwertner M, Booth M J, Wilson T
Department of Engineering Science, University of Oxford, Parks Road, Oxford OX1 3PJ, UK.
J Microsc. 2004 Sep;215(Pt 3):271-80. doi: 10.1111/j.0022-2720.2004.01371.x.
Wavefront aberrations caused by the refractive index structure of the specimen are known to compromise signal intensity and three-dimensional resolution in confocal and multiphoton microscopy. However, adaptive optics can measure and correct specimen-induced aberrations. For the design of an adaptive optics system, information on the type and amount of the aberration is required. We have previously described an interferometric set-up capable of measuring specimen-induced aberrations and a method for the extraction of the Zernike mode content. In this paper we have modelled specimen-induced aberrations caused by spherical and cylindrical objects using a ray tracing method. The Zernike mode content of the wavefronts was then extracted from the simulated wavefronts and compared with experimental results. Aberrations for a simple model of an oocyte cell consisting of two spherical regions and for a model of a well-characterized optical fibre are calculated. This simple model gave Zernike mode data that are in good agreement with experimental results.
已知样本折射率结构引起的波前像差会降低共聚焦和多光子显微镜中的信号强度及三维分辨率。然而,自适应光学可以测量并校正样本引起的像差。对于自适应光学系统的设计,需要有关像差类型和量的信息。我们之前描述了一种能够测量样本引起的像差的干涉测量装置以及一种提取泽尼克模式含量的方法。在本文中,我们使用光线追踪方法对由球形和圆柱形物体引起的样本像差进行了建模。然后从模拟波前中提取波前的泽尼克模式含量,并与实验结果进行比较。计算了由两个球形区域组成的卵母细胞简单模型以及特征明确的光纤模型的像差。这个简单模型给出的泽尼克模式数据与实验结果高度吻合。