Aguilella-Arzo Marcel, Aguilella Vicente M, Eisenberg R S
Biophysics Unit, Department of Experimental Science, Universitat Jaume I, Castellón 12080, Spain.
Eur Biophys J. 2005 Jun;34(4):314-22. doi: 10.1007/s00249-004-0452-x. Epub 2005 Mar 9.
The access resistance (AR) of a channel is an important component of the conductance of ion channels, particularly in wide and short channels, where it accounts for a substantial fraction of the total resistance to the movement of ions. The AR is usually calculated by using a classical and simple expression derived by Hall from electrostatics (J.E. Hall 1975 J. Gen. Phys. 66:531-532), though other expressions, both analytical and numerical, have been proposed. Here we report some numerical results for the AR of a channel obtained by solving the Poisson-Nernst-Planck equations at the entrance of a circular pore. Agreement is found between numerical calculations and analytical results from Hall's equation for uncharged pores in neutral membranes. However, for channels embedded in charged membranes, Hall's expression overestimates the AR, which is much lower and can even be neglected in some cases. The weak dependence of AR on the pore radius for charged membranes at low salt concentration can be exploited to separate the channel and the access contributions to the measured conductance.
通道的接入电阻(AR)是离子通道电导的一个重要组成部分,特别是在宽而短的通道中,它占离子移动总电阻的很大一部分。AR通常通过使用霍尔从静电学推导出来的经典简单表达式来计算(J.E. Hall,1975年,《普通物理学杂志》66:531 - 532),不过也有人提出了其他解析和数值表达式。在这里,我们报告了通过求解圆形孔入口处的泊松 - 能斯特 - 普朗克方程得到的通道AR的一些数值结果。对于中性膜中不带电的孔,数值计算与霍尔方程的解析结果一致。然而,对于嵌入带电膜中的通道,霍尔的表达式高估了AR,AR要低得多,在某些情况下甚至可以忽略不计。在低盐浓度下,带电膜的AR对孔半径的弱依赖性可用于分离通道和接入对测量电导的贡献。