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从高分辨率电子显微镜图像中进行结构参数的最大似然估计。第二部分:一个实际例子。

Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part II: a practical example.

作者信息

Van Aert S, den Dekker A J, van den Bos A, Van Dyck D, Chen J H

机构信息

Department of Physics, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium.

出版信息

Ultramicroscopy. 2005 Sep;104(2):107-25. doi: 10.1016/j.ultramic.2005.03.002. Epub 2005 Apr 7.

Abstract

This paper is the second part of a two-part paper on maximum likelihood (ML) estimation of structure parameters from electron microscopy images. In order to show the practical applicability of the theoretical methods described in the first part of this two-part paper, an experimental study of an aluminium crystal is presented. In this study, structure parameters, atom column distances in particular, are estimated from high-resolution transmission electron microscopy (HRTEM) images using the ML method. The necessary steps to be made in the application of this method will be worked out one by one, including model assessment, the computation of the ML parameter estimates, and the construction of confidence intervals for these parameter estimates.

摘要

本文是关于从电子显微镜图像中进行结构参数最大似然(ML)估计的两篇系列论文的第二篇。为了展示本系列第一篇论文中所描述理论方法的实际适用性,本文给出了对铝晶体的一项实验研究。在这项研究中,利用ML方法从高分辨率透射电子显微镜(HRTEM)图像中估计结构参数,特别是原子列间距。应用该方法所需的必要步骤将逐一阐述,包括模型评估、ML参数估计的计算以及这些参数估计的置信区间构建。

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