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三维脑部磁共振成像数据中皮质厚度的测量:拉普拉斯方法的验证

Measurement of cortical thickness in 3D brain MRI data: validation of the Laplacian method.

作者信息

Haidar Haissam, Soul Janet S

机构信息

Department of Neurology, Children's Hospital and Harvard Medical School, Boston, Massachusetts 02115, USA.

出版信息

J Neuroimaging. 2006 Apr;16(2):146-53. doi: 10.1111/j.1552-6569.2006.00036.x.

Abstract

OBJECTIVES

We aimed to determine the precision of the Laplacian approach for cortical thickness measurement due to changes in computational and acquisition parameters. We compared these results to two other methods widely used in clinical research using brain MRI data.

MATERIALS AND METHODS

Brain MRI scans were obtained in 10 healthy adults using three different sets of acquisition parameters. The first and the second acquisitions used different slice thickness but the same head position. The third scan was performed after head repositioning. We measured cerebral cortical thickness in all brain segmentations using three thickness methods: Laplacian, nearest distance, and the orthogonal projection.

RESULTS

The Laplacian method demonstrated the least variability with regard to the effect of interchange of boundaries, slice thickness, and repositioning of the head, compared with the other two methods.

CONCLUSION

The Laplacian method is the most precise and reliable tool for in vivo cortical thickness measurement using brain MRI data.

摘要

目的

我们旨在确定由于计算和采集参数的变化,拉普拉斯方法用于测量皮质厚度的精度。我们将这些结果与临床研究中广泛使用的另外两种利用脑MRI数据的方法进行比较。

材料与方法

使用三组不同的采集参数对10名健康成年人进行脑MRI扫描。第一次和第二次采集使用不同的切片厚度但头部位置相同。第三次扫描在头部重新定位后进行。我们使用三种厚度测量方法在所有脑部分割中测量脑皮质厚度:拉普拉斯法、最近距离法和正交投影法。

结果

与其他两种方法相比,拉普拉斯方法在边界互换、切片厚度和头部重新定位的影响方面表现出最小的变异性。

结论

拉普拉斯方法是使用脑MRI数据进行体内皮质厚度测量的最精确和可靠的工具。

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