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从深度分辨的紫外-可见漫反射光谱对双层上皮组织模型的光学特性进行序贯估计。

Sequential estimation of optical properties of a two-layered epithelial tissue model from depth-resolved ultraviolet-visible diffuse reflectance spectra.

作者信息

Liu Quan, Ramanujam Nirmala

机构信息

Department of Biomedical Engineering, Duke University, Durham, North Carolina 27708-0281, USA.

出版信息

Appl Opt. 2006 Jul 1;45(19):4776-90. doi: 10.1364/ao.45.004776.

Abstract

A method for estimating the optical properties of two-layered media (such as squamous epithelial tissue) over a range of wavelengths in the ultraviolet-visible spectrum is proposed and tested with Monte Carlo modeling. The method first used a fiber-optic probe with angled illumination and the collection fibers placed at a small separation (<or=300 microm) to restrict the transport of detected light to the top layer. A Monte Carlo-based inverse model for a homogeneous medium was employed to estimate the top layer optical properties from the measured diffuse reflectance spectrum. Then a flat-tip probe with a large source-detector separation (>or=1000 microm) was used to detect diffuse reflectance preferentially from the bottom layer. A second Monte Carlo-based inverse model for a two-layered medium was applied to estimate the bottom layer optical properties, as well as the top layer thickness, given that the top layer optical properties have been estimated. The results of Monte Carlo validation show that this method works well for an epithelial tissue model with a top layer thickness ranging from 200 to 500 microm. For most thicknesses within this range, the absorption coefficients were estimated to within 15% of the true values, the reduced scattering coefficients were estimated to within 20% and the top layer thicknesses were estimated to within 20%. The application of a variance reduction technique to the Monte Carlo modeling proved to be effective in improving the accuracy with which the optical properties are estimated.

摘要

提出了一种在紫外 - 可见光谱范围内估计两层介质(如鳞状上皮组织)光学特性的方法,并通过蒙特卡罗建模进行了测试。该方法首先使用具有倾斜照明的光纤探头,将收集光纤放置在较小间距(≤300微米)处,以限制检测光传输到顶层。采用基于蒙特卡罗的均匀介质逆模型,根据测量的漫反射光谱估计顶层光学特性。然后使用源 - 探测器间距较大(≥1000微米)的平头探头优先检测来自底层的漫反射。在已估计顶层光学特性的情况下,应用基于蒙特卡罗的两层介质逆模型来估计底层光学特性以及顶层厚度。蒙特卡罗验证结果表明,该方法对于顶层厚度在200至500微米范围内的上皮组织模型效果良好。对于该范围内的大多数厚度,吸收系数估计值与真实值的偏差在15%以内,约化散射系数估计值偏差在20%以内,顶层厚度估计值偏差在20%以内。事实证明,将方差缩减技术应用于蒙特卡罗建模可有效提高光学特性的估计精度。

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