Hayles M F, Stokes D J, Phifer D, Findlay K C
FEI Company, Building AAE, 5600 KA Eindhoven, The Netherlands.
J Microsc. 2007 Jun;226(Pt 3):263-9. doi: 10.1111/j.1365-2818.2007.01775.x.
The combination of focused ion beam and scanning electron microscopy with a cryo-preparation/transfer system allows specimens to be milled at low temperatures. However, for biological specimens in particular, the quality of results is strongly dependent on correct preparation of the specimen surface. We demonstrate a method for deposition of a protective, planarizing surface layer onto a cryo-sample, enabling high-quality cross-sectioning using the ion beam and investigation of structures at the nanoscale.
聚焦离子束与配备低温制备/转移系统的扫描电子显微镜相结合，能够在低温下对样品进行铣削。然而，特别是对于生物样品，结果的质量在很大程度上取决于样品表面的正确制备。我们展示了一种在低温样品上沉积保护性、平整表面层的方法，从而能够使用离子束进行高质量的横截面切割，并对纳米级结构进行研究。
