Ventalon Cathie, Heintzmann Rainer, Mertz Jerome
Boston University, Department of Biomedical Engineering, Boston, Massachusetts 02215, USA.
Opt Lett. 2007 Jun 1;32(11):1417-9. doi: 10.1364/ol.32.001417.
Dynamic speckle illumination (DSI) provides a simple and robust technique to obtain fluorescence depth sectioning with a widefield microscope. We report a significant improvement to DSI microscopy based on a statistical image-processing algorithm that incorporates spatial wavelet prefiltering. The resultant gain in sectioning strength leads to a fundamentally improved scaling law for the out-of-focus background rejection.
动态散斑照明（DSI）提供了一种简单而稳健的技术，可通过宽视场显微镜获得荧光深度切片。我们报告了基于一种结合空间小波预滤波的统计图像处理算法对DSI显微镜的重大改进。切片强度的由此产生的增益导致了用于离焦背景抑制的基本改进的缩放定律。
