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磁共振电阻抗成像中基于横向J替代算法的低水平电流注入电导率成像

Conductivity imaging with low level current injection using transversal J-substitution algorithm in MREIT.

作者信息

Nam Hyun Soo, Lee Byung Il, Choi Jongsung, Park Chunjae, Kwon Oh In

机构信息

Department of Mathematics, Konkuk University, Korea.

出版信息

Phys Med Biol. 2007 Nov 21;52(22):6717-30. doi: 10.1088/0031-9155/52/22/011. Epub 2007 Oct 30.

Abstract

An aim of magnetic resonance electrical impedance tomography (MREIT) is to visualize the internal current density and conductivity of the electrically imaged object by injecting current through electrodes attached to it. Due to a limited amount of injection current, one of the most important factors in MREIT is how to control the noise contained in the measured magnetic flux density data. This paper describes a new iterative algorithm called the transversal J-substitution algorithm which is robust to measured noise. As a result, the proposed transversal J-substitution algorithm considerably improves the quality of the reconstructed conductivity image under a low injection current. The relation between the reconstructed contrast of conductivity and the measured noise in the magnetic flux density is analyzed. We show that the contrast of first update of the conductivity with a homogeneous initial guess using the proposed algorithm has sufficient distinguishability to detect the anomaly. Results from numerical simulations demonstrate that the transversal J-substitution algorithm is robust to the noise. For practical implementations of MREIT, we tested real experiments in an agarose gel phantom using low current injection with amplitudes 1 mA and 5 mA to reconstruct the interior conductivity distribution.

摘要

磁共振电阻抗断层成像(MREIT)的一个目标是通过将电流注入附着在电成像物体上的电极,来可视化该物体的内部电流密度和电导率。由于注入电流的量有限,MREIT中最重要的因素之一是如何控制测量磁通密度数据中包含的噪声。本文描述了一种名为横向J替代算法的新迭代算法,该算法对测量噪声具有鲁棒性。结果表明,所提出的横向J替代算法在低注入电流下显著提高了重建电导率图像的质量。分析了电导率重建对比度与磁通密度测量噪声之间的关系。我们表明,使用所提出的算法,在均匀初始猜测下电导率的首次更新对比度具有足够的可区分性来检测异常。数值模拟结果表明,横向J替代算法对噪声具有鲁棒性。对于MREIT的实际应用,我们在琼脂糖凝胶模型中使用1 mA和5 mA幅度的低电流注入进行了实际实验,以重建内部电导率分布。

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