Yuan Jun, Wang Zhiwei, Fu Xin, Xie Lin, Sun Yuekui, Gao Shangpeng, Jiang Jun, Hu Xuerang, Xu Chen
Department of Materials Science, Tsinghua University, Beijing 100084, China.
Micron. 2008 Aug;39(6):658-65. doi: 10.1016/j.micron.2007.10.010. Epub 2007 Oct 22.
Electron energy-loss spectroscopy (EELS) has been well established in providing the composition and chemical bonding information of materials, particularly for light elements. Its potential for structural determination has long been known but has yet to be fully explored. With the convergence of rapid development in computing power and improvement in the efficiency of the material specific electronic structure simulation, plus the recent breakthrough in the development of C(s)-corrected electron microscopy, the reconstruction of the local three dimensional structure of nanomaterial using EELS in conjunction with advanced structural imaging and diffraction techniques is becoming increasingly feasible. In this paper, we will review from our own examples the progress in EELS instrumentation, methods and simulation to illustrate the progress that has been made. They include the density-function-theory-based ab initio spectroscopic simulation for standard-less fingerprint applications for metastable polymorph identification, magic angle electron energy-loss spectroscopy as well as recent results from the dual-detectors EELS system which allows the energy instability of the spectrometer to be analyzed in real-time and eventually compensated on-line.
电子能量损失谱(EELS)在提供材料的成分和化学键信息方面已得到广泛应用,特别是对于轻元素。其在结构测定方面的潜力早已为人所知,但尚未得到充分探索。随着计算能力的快速发展与材料特定电子结构模拟效率的提高,以及最近在C(s)校正电子显微镜开发方面的突破,结合先进的结构成像和衍射技术,利用EELS重建纳米材料的局部三维结构变得越来越可行。在本文中,我们将通过自身实例回顾EELS仪器、方法和模拟方面的进展,以说明所取得的进步。这些进展包括基于密度泛函理论的从头算光谱模拟,用于亚稳多晶型物鉴定的无标准指纹应用、魔角电子能量损失谱,以及双探测器EELS系统的最新结果,该系统允许实时分析光谱仪的能量不稳定性并最终在线补偿。