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对共价连接到金叉指微电极上的DNA发夹的温度诱导熔化转变进行电学检测。

Electrical detection of the temperature induced melting transition of a DNA hairpin covalently attached to gold interdigitated microelectrodes.

作者信息

Brewood Greg P, Rangineni Yaswanth, Fish Daniel J, Bhandiwad Ashwini S, Evans David R, Solanki Raj, Benight Albert S

机构信息

Portland Bioscience, Inc., Portland, OR 97201, USA.

出版信息

Nucleic Acids Res. 2008 Sep;36(15):e98. doi: 10.1093/nar/gkn436. Epub 2008 Jul 15.

Abstract

The temperature induced melting transition of a self-complementary DNA strand covalently attached at the 5' end to the surface of a gold interdigitated microelectrode (GIME) was monitored in a novel, label-free, manner. The structural state of the hairpin was assessed by measuring four different electronic properties of the GIME (capacitance, impedance, dissipation factor and phase angle) as a function of temperature from 25 degrees C to 80 degrees C. Consistent changes in all four electronic properties of the GIME were observed over this temperature range, and attributed to the transition of the attached single-stranded DNA (ssDNA) from an intramolecular, folded hairpin structure to a melted ssDNA. The melting curve of the self-complementary single strand was also measured in solution using differential scanning calorimetry (DSC) and UV absorbance spectroscopy. Temperature dependent electronic measurements on the surface and absorbance versus temperature values measured in solution experiments were analyzed assuming a two-state process. The model analysis provided estimates of the thermodynamic transition parameters of the hairpin on the surface. Two-state analyses of optical melting data and DSC measurements provided evaluations of the thermodynamic transition parameters of the hairpin in solution. Comparison of surface and solution measurements provided quantitative evaluation of the effect of the surface on the thermodynamics of the melting transition of the DNA hairpin.

摘要

以一种新颖的、无标记的方式监测了一条在5'端共价连接到金叉指微电极(GIME)表面的自互补DNA链的温度诱导熔解转变。通过测量GIME的四种不同电学性质(电容、阻抗、耗散因子和相角)随温度从25℃到80℃的变化来评估发夹结构的状态。在这个温度范围内观察到GIME的所有四种电学性质都有一致的变化,并将其归因于附着的单链DNA(ssDNA)从分子内折叠发夹结构转变为熔解的ssDNA。还使用差示扫描量热法(DSC)和紫外吸收光谱法在溶液中测量了自互补单链的熔解曲线。假设为二态过程,对表面上与温度相关的电学测量以及溶液实验中测量的吸光度与温度值进行了分析。模型分析提供了表面上发夹的热力学转变参数的估计值。对光学熔解数据和DSC测量的二态分析提供了溶液中发夹的热力学转变参数的评估。表面和溶液测量结果的比较提供了对表面对DNA发夹熔解转变热力学影响的定量评估。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/912c/2528165/b733da387b1a/gkn436f1.jpg

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