Marquardt Christoph W, Dehm Simone, Vijayaraghavan Aravind, Blatt Sabine, Hennrich Frank, Krupke Ralph
Forschungszentrum Karlsruhe, Institut fur Nanotechnologie, D-76021 Karlsruhe, Germany.
Nano Lett. 2008 Sep;8(9):2767-72. doi: 10.1021/nl801288d. Epub 2008 Aug 14.
We report on reversible metal to insulator transitions in metallic single-walled carbon nanotube devices induced by repeated electron irradiation of a nanotube segment. The transition from a low-resistive, metallic state to a high-resistive, insulating state by 3 orders of magnitude was monitored by electron transport measurements. Application of a large voltage bias leads to a transition back to the original metallic state. Both states are stable in time, and transitions are fully reversible and reproducible. The data is evidence for a local perturbation of the nanotube electronic system by removable trapped charges in the underneath substrate and excludes structural damage of the nanotube. The result has implications for using electron-beam lithography in nanotube device fabrication.
我们报道了通过对纳米管段进行重复电子辐照,在金属单壁碳纳米管器件中诱导出的可逆金属 - 绝缘体转变。通过电子输运测量监测到从低电阻金属态到高电阻绝缘态的转变幅度达3个数量级。施加较大的电压偏置会导致转变回原始金属态。两种状态在时间上都是稳定的,并且转变是完全可逆和可重复的。这些数据证明了下方衬底中可移除的俘获电荷对纳米管电子系统的局部扰动,并且排除了纳米管的结构损伤。该结果对在纳米管器件制造中使用电子束光刻具有重要意义。