Joint Laboratory for Attosecond Science, National Research Council of Canada and University of Ottawa, 100 Sussex Drive, Ottawa, ON K1A 0R6, Canada.
Opt Lett. 2009 Oct 1;34(19):3026-8. doi: 10.1364/OL.34.003026.
We introduce and demonstrate a novel concept of frequency-resolved wavefront characterization. Our approach is particularly suitable for high-harmonic, extreme-UV (XUV) and soft X-ray radiation. The concept is based on an analysis of radiation diffracted from a slit scanned in front of a flat-field XUV spectrometer. With the spectrally resolved signal spread across one axis and the spatially resolved diffraction pattern in the other dimension, we reconstruct the wavefront. While demonstrated for high harmonics, the method is not restricted in wavelength.
我们介绍并演示了一种新颖的频率分辨波前表征概念。我们的方法特别适用于高次谐波、极紫外（XUV）和软 X 射线辐射。该概念基于对从平面场 XUV 光谱仪前扫描的狭缝衍射的分析。通过将光谱分辨信号在一个轴上展开，同时在另一维上展开空间分辨的衍射图案，我们可以重建波前。虽然该方法是针对高次谐波演示的，但它不限于波长。
