College of Life Science, Northeast Forestry University, 150040 Harbin, China.
Mol Biol Rep. 2010 Feb;37(2):1111-7. doi: 10.1007/s11033-009-9870-2.
Wheat (Triticum aestivum L.) stem rust caused by Puccinia graminis f. sp. tritici is one of the main diseases of wheat worldwide. Wheat mutant line D51, which was derived from the highly susceptible cultivar L6239, shows resistance to the prevailing races 21C3CPH, 21C3CKH, and 21C3CTR of P. graminis f. sp. tritici in China. In this study, we used the cDNA-AFLP technology to identify the genes that are likely involved in the stem rust resistance. EcoRI/MseI selective primers were used to generate approximately 1920 DNA fragments. Seventy five differentially transcribed fragments (3.91%) were identified by comparing the samples of 21C3CPH infected D51 with infected L6239 or uninfected D51. Eleven amplified cDNA fragments were sequenced. Eight showed significant similarity to known genes, including TaLr1 (leaf rust resistance gene), wlm24 (wheat powdery mildew resistance gene), stress response genes and ESTs of environment stress of tall fescue. These identified genes are involved in plant defense response and stem rust resistance and need further research to determine their usefulness in breeding new resistance cultivars.
小麦秆锈病由禾柄锈菌引起，是世界范围内小麦的主要病害之一。小麦突变系 D51 源自高度感病品种 L6239，对中国流行的禾柄锈菌生理小种 21C3CPH、21C3CKH 和 21C3CTR 表现出抗性。本研究采用 cDNA-AFLP 技术鉴定与小麦秆锈病抗性相关的基因。EcoRI/MseI 选择引物用于产生约 1920 个 DNA 片段。通过比较 21C3CPH 感染的 D51 与感染的 L6239 或未感染的 D51 的样本，鉴定出 75 个差异转录片段（3.91%）。对 11 个扩增的 cDNA 片段进行测序。其中 8 个与已知基因有显著相似性，包括 TaLr1（叶锈病抗性基因）、wlm24（小麦白粉病抗性基因）、应激反应基因和高羊茅环境应激的 ESTs。这些鉴定出的基因参与植物防御反应和秆锈病抗性，需要进一步研究以确定它们在培育新的抗性品种中的用途。
