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铌的电子能量损失谱(EELS)和化学计量氧化铌相——第二部分:定量分析。

EELS of niobium and stoichiometric niobium-oxide phases--Part II: quantification.

机构信息

Laboratorium für Elektronenmikroskopie, Universität Karlsruhe (TH), D-76128 Karlsruhe, Germany.

出版信息

Microsc Microanal. 2009 Dec;15(6):524-38. doi: 10.1017/S1431927609991061. Epub 2009 Oct 26.

DOI:10.1017/S1431927609991061
PMID:19852875
Abstract

A comprehensive electron energy-loss spectroscopy (EELS) study of niobium (Nb) and stable Nb-oxide phases (NbO, NbO2, Nb2O5) was carried out. Part II of this work is devoted to quantitative EELS by means of experimental k-factors derived from the intensity ratio of the O-K edge and the Nb-M4,5 or Nb-M2,3 edges for all three stable Nb-oxides. The precision and accuracy of the quantification are investigated with respect to the influence of intensity-measurement energy windows, background subtraction, and sample thickness. Integration-window widths allowing optimum accuracy are determined. Owing to background-subtraction errors, the Nb-M4,5 edges rather than Nb-M2,3 are preferred for quantification. Different approaches are applied to improve the precision with regard to thickness-related errors. Thus, a precision up to +/-1.5% is achieved by averaging spectra from all three reference oxides to determine a k-factor using Nb-M4,5. Using the experimental k-factor, the determination of atomic concentration ratios CNb/CO in the range of 0.4 (Nb2O5) to 1 (NbO) was found to be possible with an accuracy of 0.6% (relative deviation between measured and nominal composition), whereas ratios of calculated partial ionization cross sections lead to less accurate results.

摘要

进行了铌(Nb)和稳定的 Nb-氧化物相(NbO、NbO2、Nb2O5)的全面电子能量损失谱(EELS)研究。这项工作的第二部分致力于通过实验 k 因子进行定量 EELS,该因子源自 O-K 边缘与 Nb-M4,5 或 Nb-M2,3 边缘的强度比,适用于所有三种稳定的 Nb-氧化物。研究了强度测量能窗、背景扣除和样品厚度对定量的精度和准确性的影响。确定了允许最佳准确性的积分窗口宽度。由于背景扣除误差,与定量相比,更倾向于使用 Nb-M4,5 边缘。应用了不同的方法来提高与厚度相关的误差的精度。因此,通过从所有三种参考氧化物的光谱中平均来确定使用 Nb-M4,5 的 k 因子,可以达到 +/-1.5%的精度。使用实验 k 因子,可以在 0.4(Nb2O5)至 1(NbO)的范围内确定原子浓度比 CNb/CO,精度为 0.6%(测量和名义组成之间的相对偏差),而计算的部分电离截面比导致不太准确的结果。

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