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使用表面等离子体共振技术测量表面电荷密度和颗粒高度。

Measuring surface charge density and particle height using surface plasmon resonance technique.

机构信息

Department of Electrical Engineering, Center for Bioelectronics and Biosensors, Biodesign Institute, Arizona State University, Tempe, Arizona 85287-5801, USA.

出版信息

Anal Chem. 2010 Jan 1;82(1):234-40. doi: 10.1021/ac901816z.

Abstract

We demonstrate a method to measure surface charge density and particle height using surface plasmon resonance (SPR) detection. It is based on two facts: (1) The equilibrium height of a charged particle over a charged surface depends on the electrostatic interaction between the particle and the surface; and (2) SPR is extremely sensitive to the height of the particle. We perform numerical simulations to establish the relations between the SPR signal and the particle height, and between the particle height and the surface charge density, and carry out systematic experiments, including effects of different buffer concentrations, particle sizes, and concentrations, to examine the relations. The simulation and experimental results are in good agreement with each other. Using the method, we determine surface charge density of gold surface functionalized with different molecules. If the surface charge density is known, the method can also be used to determine the charges of the particles.

摘要

我们展示了一种使用表面等离子体共振(SPR)检测来测量表面电荷密度和粒子高度的方法。它基于两个事实:(1)带电荷的粒子在带电荷的表面上的平衡高度取决于粒子和表面之间的静电相互作用;(2)SPR 对粒子的高度非常敏感。我们进行数值模拟以建立 SPR 信号与粒子高度之间的关系,以及粒子高度与表面电荷密度之间的关系,并进行了系统的实验,包括不同缓冲浓度、粒子大小和浓度的影响,以检验这些关系。模拟和实验结果非常吻合。使用该方法,我们确定了不同分子功能化的金表面的表面电荷密度。如果知道表面电荷密度,该方法也可用于确定粒子的电荷。

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