Hass G, Ramsey J B, Heaney J B, Triolo J J
Appl Opt. 1969 Feb 1;8(2):275-81. doi: 10.1364/AO.8.000275.
The reflectance, solar absorptivity (alpha), and the total normal and hemispherical emissivity (epsilonNu and epsilon) of evaporated aluminum coated with SiO(2) films of various thicknesses were determined. High vacuum evaporation with an electron gun was used for preparing uv transparent undecomposed films of SiO(2) up to thicknesses of more than 3.5 micro Because of their hardness, chemical stability, and excellent adherence, evaporated SiO(2) films were found to be very suitable as protective layers for aluminum front surface mirrors, especially if high reflectance in the uv is required. alpha of SiO(2)-coated Al was determined to be about 11 % and to be essentially independent of the SiO(2) thickness, whereas epsilonNu and epsilon increased with increasing oxide thickness, and reached values of 0.62 and 0.55, respectively, for a SiO(2) thickness of 3.75 micro. Films of this type are, therefore, suitable as surface layers for controlling the temperature of satellites in orbit. Ultraviolet irradiation in vacuum at one and five times the equivalent solar energy decreased the uv and visible reflectance of SiO(2)-coated Al. The effect of this reflectance decrease on alpha/epsilon and on the temperature of an orbiting satellite is discussed.
测定了涂覆不同厚度SiO₂薄膜的蒸发铝的反射率、太阳吸收率（α）以及总法向发射率和半球发射率（εNu和ε）。采用电子枪高真空蒸发法制备了厚度超过3.5微米的紫外透明且未分解的SiO₂薄膜。由于其硬度、化学稳定性和优异的附着力，发现蒸发的SiO₂薄膜非常适合作为铝制前表面镜的保护层，特别是在需要紫外高反射率的情况下。涂覆SiO₂的铝的α被测定为约11%，并且基本上与SiO₂厚度无关，而εNu和ε随着氧化物厚度的增加而增加，对于3.75微米厚的SiO₂，分别达到0.62和0.55的值。因此，这类薄膜适合作为轨道卫星温度控制的表面层。在真空中以等效太阳能的1倍和5倍进行紫外线照射，降低了涂覆SiO₂的铝的紫外和可见光反射率。讨论了这种反射率降低对α/ε以及轨道卫星温度的影响。
