Shaffer P T
Appl Opt. 1971 May 1;10(5):1034-6. doi: 10.1364/AO.10.001034.
The refractive index of each of the four common silicon carbide polytypes has been measured over the visible range. The data were analyzed in an attempt to relate the birefringence to the relative hexagonal character of the polytype. A general relationship exists, namely, that the birefringence increases with increasing hexagonal character of the polytype. This relationship is not sufficiently precise to use for the identification of polytypes.
已在可见光范围内测量了四种常见碳化硅多型体各自的折射率。对这些数据进行了分析，试图将双折射与多型体的相对六方特性联系起来。存在一种普遍关系，即双折射随着多型体六方特性的增加而增加。这种关系不够精确，无法用于多型体的鉴定。
