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掩埋氧化物层较薄的绝缘体上硅衬底上的纳米光子器件。

Nanophotonic devices on thin buried oxide Silicon-On-Insulator substrates.

作者信息

Sridaran Suresh, Bhave Sunil A

机构信息

OxideMEMS Lab, School of Electrical and Computer Engineering, Cornell University, Ithaca, NY 14850, USA.

出版信息

Opt Express. 2010 Feb 15;18(4):3850-7. doi: 10.1364/OE.18.003850.

Abstract

We demonstrate a silicon photonic platform using thin buried oxide silicon-on-insulator (SOI) substrates using localized substrate removal. We show high confinement silicon strip waveguides, micro-ring resonators and nanotapers using this technology. Propagation losses for the waveguides using the cutback method are 3.88 dB/cm for the quasi-TE mode and 5.06 dB/cm for the quasi-TM mode. Ring resonators with a loaded quality factor (Q) of 46,500 for the quasi-TM mode and intrinsic Q of 148,000 for the quasi-TE mode have been obtained. This process will enable the integration of photonic structures with thin buried oxide SOI based electronics.

摘要

我们展示了一种使用局部衬底去除的薄埋氧绝缘体上硅(SOI)衬底的硅光子平台。我们展示了使用该技术的高限制硅条形波导、微环谐振器和纳米锥。使用截短法测量的波导在准TE模式下的传播损耗为3.88 dB/cm,在准TM模式下为5.06 dB/cm。已获得准TM模式下负载品质因数(Q)为46,500且准TE模式下本征Q为148,000的环形谐振器。该工艺将实现光子结构与基于薄埋氧SOI的电子器件的集成。

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