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基于干涉测量技术的光波导器件故障定位新测量系统。

New measurement system for fault location in optical waveguide devices based on an interferometric technique.

作者信息

Takada K, Yokohama I, Chida K, Noda J

出版信息

Appl Opt. 1987 May 1;26(9):1603-6. doi: 10.1364/AO.26.001603.

DOI:10.1364/AO.26.001603
PMID:20454375
Abstract

A new measurement system for fault location in optical waveguide devices is presented. The system consists of a fiber-optic Mach-Zehnder and a bulk-type Michelson interferometers. The spatial resolution of the scatter distribution is <380 microm, which is limited by the averaging time. The minimum detectable backscattered power is -116 dB relative to the light power propagating in the waveguides. Preliminary experimental results using single-mode fibers <10 cm long are demonstrated.

摘要

介绍了一种用于光波导器件故障定位的新型测量系统。该系统由一个光纤马赫-曾德尔干涉仪和一个体式迈克尔逊干涉仪组成。散射分布的空间分辨率小于380微米,这受平均时间限制。相对于在波导中传播的光功率,最小可检测背向散射功率为-116 dB。展示了使用长度小于10厘米的单模光纤的初步实验结果。

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