Niels Bohr Institute, University of Copenhagen, DK-2100 Copenhagen, Denmark.
Phys Med Biol. 2010 Jun 21;55(12):3317-23. doi: 10.1088/0031-9155/55/12/004. Epub 2010 May 18.
We introduce a novel x-ray imaging approach that yields information about the local texture of structures smaller than the image pixel resolution inside an object. The approach is based on a recently developed x-ray dark-field imaging technique, using scattering from sub-micron structures in the sample. We show that the method can be used to determine the local angle and degree of orientation of bone, and fibers in a leaf. As the method is based on the use of a conventional x-ray tube we believe that it can have a great impact on medical diagnostics and non-destructive testing applications.
我们介绍了一种新的 X 射线成像方法，该方法可以提供物体内部小于图像像素分辨率的结构的局部纹理信息。该方法基于最近开发的 X 射线暗场成像技术，利用样品中亚微米结构的散射。我们表明，该方法可用于确定骨和叶片中纤维的局部角度和方向。由于该方法基于常规 X 射线管的使用，我们相信它将对医学诊断和无损检测应用产生重大影响。
