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利用光学荧光对倏逝波强度分布进行定量研究。

Quantitative studies of evanescent wave intensity profiles using optical fluorescence.

作者信息

Edwards J, Ausserre D, Hervet H, Rondelez F

出版信息

Appl Opt. 1989 May 15;28(10):1881-4. doi: 10.1364/AO.28.001881.

DOI:10.1364/AO.28.001881
PMID:20548761
Abstract

The fluorescence of uniformly distributed chromophores in an organic solution has been used to probe the energy density profile of an optical evanescent wave, generated by total internal reflection at the solid-solution interface. The results obtained in the case of an aqueous fluorescein solution in contact with a highly polished silica surface are in good quantitative agreement with the expected exponential decay of the optical energy at the interface. It also justifies the use of the newly developed evanescent wave-induced fluorescence technique to study adsorption and depletion layers of polymer in solution close to solids walls. In such experiments the fluorescence intensity is assumed to be the Laplace transform of the concentration profile of the fluorescently labeled polymer chains. The present data validate the above assumption.

摘要

有机溶液中均匀分布发色团的荧光已被用于探测由固-液界面全内反射产生的光学倏逝波的能量密度分布。在与高度抛光的二氧化硅表面接触的荧光素水溶液的情况下获得的结果,与界面处光能量预期的指数衰减在定量上吻合良好。这也证明了使用新开发的倏逝波诱导荧光技术来研究聚合物在靠近固体壁的溶液中的吸附层和耗尽层是合理的。在这类实验中,荧光强度被假定为荧光标记聚合物链浓度分布的拉普拉斯变换。目前的数据验证了上述假设。

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