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抑制 CdSe/CdS 点/棒中的双激子俄歇复合:载流子动力学中的电子结构作用。

Suppression of biexciton auger recombination in CdSe/CdS dot/rods: role of the electronic structure in the carrier dynamics.

机构信息

Dipartimento di Fisica, Istituto di Fotonica e Nanotecnologie IFN-CNR, Politecnico di Milano, P zza Leonardo da Vinci 32, 20133 Milano, Italy.

出版信息

Nano Lett. 2010 Aug 11;10(8):3142-50. doi: 10.1021/nl101930z.

Abstract

We studied carrier dynamics in semiconductor nanocrystals consisting of a small CdSe dot embedded in an elongated, rod-shaped CdS shell, using the ultrafast pump-probe technique. We found clear evidence of a substantial suppression of the Auger nonradiative recombination in the biexciton regime. Moreover, a simple model of the dynamics in which biexcitons show no Auger recombination, and only holes are localized in the dot, fits well the differential transmission observed at all pump densities. The long biexciton lifetime results into an observed long-living gain having a peak that is red shifted with respect to the lowest energy absorption peak. We argue that the origin of the large relative gain observed at large fillings is related to the peculiar structure of the electronic levels, and in particular, to delocalization of electrons in the rod.

摘要

我们使用超快泵浦探针技术研究了由嵌入在拉长的棒状 CdS 壳中的小 CdSe 点组成的半导体纳米晶体中的载流子动力学。我们发现了在双激子态下,俄歇非辐射复合被显著抑制的明显证据。此外,一个简单的动力学模型表明,双激子中没有俄歇复合,只有空穴被局限在点中,该模型很好地拟合了在所有泵浦密度下观察到的微分透射。长双激子寿命导致观察到的长寿命增益,其峰值相对于最低能量吸收峰发生红移。我们认为,在高填充度下观察到的大相对增益的起源与电子能级的特殊结构有关,特别是与棒中电子的离域化有关。

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