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相对湿度对 PPy:PSS 薄膜纳米形貌和介电常数的影响。

Influence of relative humidity on the nanoscopic topography and dielectric constant of thin films of PPy:PSS.

机构信息

Max Planck Institute for Polymer Research, Ackermannweg 10, 55118 Mainz, Germany.

出版信息

Small. 2011 Apr 4;7(7):950-6. doi: 10.1002/smll.201100204. Epub 2011 Mar 11.

Abstract

The morphological, electric, and dielectric properties of water-based conjugated polymer blends, such as polypyrrole:polystyrene sulfonate (PPy:PSS) or poly(3,4-ethylenedioxythiophene):polystyrene sulfonate (PEDOT:PSS), are known to be influenced by the water content. These properties also influence the macroscopic performance when the conjugated polymer blends are employed in a device. An in situ humidity-dependence study on thin films of PPy:PSS by Kelvin probe force microscopy (KPFM) is presented. A particular KPFM mode, dielectric imaging, is used, which detects the second harmonic electrostatic force. Thin PPy:PSS films are drop-coated on hydrophobic graphite substrates. Upon increasing the relative humidity, the hydrophilic PSS is swelled and dewetted on the substrate, while the hydrophobic PPy remains almost unchanged. The swelling and dewetting of PSS results in irreversible morphological changes in the thin films, as well as nanoscopic rearrangement on the surface of the PPy:PSS films. The nanoscopic rearrangement can only be detected by dielectric imaging. It is also observed that relative humidity affects unannealed and thermally annealed PPy:PSS thin films differently.

摘要

水基共轭聚合物共混物(如聚吡咯:聚苯乙烯磺酸盐(PPy:PSS)或聚(3,4-亚乙基二氧噻吩):聚苯乙烯磺酸盐(PEDOT:PSS))的形态、电和介电性能已知受水分含量的影响。当将共轭聚合物共混物用于设备中时,这些特性也会影响宏观性能。本文通过 Kelvin 探针力显微镜(KPFM)对 PPy:PSS 薄膜进行了原位湿度依赖性研究。使用了一种特殊的 KPFM 模式,即介电成像,用于检测二次静电引力。将薄的 PPy:PSS 薄膜滴涂在疏水性石墨基底上。随着相对湿度的增加,亲水性 PSS 在基底上溶胀并去湿,而疏水性 PPy 几乎保持不变。PSS 的溶胀和去湿导致薄膜的形态发生不可逆变化,以及 PPy:PSS 薄膜表面的纳米级重排。只有介电成像才能检测到纳米级重排。还观察到相对湿度对未经退火和热退火的 PPy:PSS 薄膜的影响不同。

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