• 文献检索
  • 文档翻译
  • 深度研究
  • 学术资讯
  • Suppr Zotero 插件Zotero 插件
  • 邀请有礼
  • 套餐&价格
  • 历史记录
应用&插件
Suppr Zotero 插件Zotero 插件浏览器插件Mac 客户端Windows 客户端微信小程序
定价
高级版会员购买积分包购买API积分包
服务
文献检索文档翻译深度研究API 文档MCP 服务
关于我们
关于 Suppr公司介绍联系我们用户协议隐私条款
关注我们

Suppr 超能文献

核心技术专利:CN118964589B侵权必究
粤ICP备2023148730 号-1Suppr @ 2026

文献检索

告别复杂PubMed语法,用中文像聊天一样搜索,搜遍4000万医学文献。AI智能推荐,让科研检索更轻松。

立即免费搜索

文件翻译

保留排版,准确专业,支持PDF/Word/PPT等文件格式,支持 12+语言互译。

免费翻译文档

深度研究

AI帮你快速写综述,25分钟生成高质量综述,智能提取关键信息,辅助科研写作。

立即免费体验

使用 DualEELS 对多相多晶立方氮化硼工具材料进行定量分析。

A quantitative analysis of a multi-phase polycrystalline cubic boron nitride tool material using DualEELS.

机构信息

R&D Sandvik Tooling, SE-126 80 Stockholm, Sweden.

出版信息

Micron. 2011 Aug;42(6):608-15. doi: 10.1016/j.micron.2011.02.006. Epub 2011 Mar 5.

DOI:10.1016/j.micron.2011.02.006
PMID:21459005
Abstract

This paper presents a quantitative analysis of a polycrystalline cubic boron nitride tool material by electron energy-loss spectroscopy spectrum imaging acquired in dual range mode. Having both the low-loss and core-loss regions acquired nearly simultaneously provides the advantage of accurate corrections for thickness effects and thus the possibility to perform quantification calculations. This has resulted in extracted bonding maps with areal (atoms/nm(2)) or volumetric (atoms/nm(3)) densities. Spectroscopic signatures in the low-loss and core-loss energy ranges, of the elements (Al, B, C, N, Ti and O) present in the existing phases, were studied and used when extracting the element specific bonding maps by the multiple linear least squares fitting procedure. Variations of elemental concentrations across the investigated area were determined, despite of phase overlap in the beam direction or energy overlaps in the EELS spectrum. Moreover, the surface oxidation of Ti(C,N) and AlN as well as the amorphisation of α-Al(2)O(3) is discussed.

摘要

本文通过在双通道模式下采集的电子能量损失光谱谱成像对多晶立方氮化硼刀具材料进行了定量分析。低损耗和芯损耗区域几乎同时采集,这具有厚度效应准确校正的优势,从而有可能进行定量计算。这导致提取了具有面(原子/nm²)或体(原子/nm³)密度的键合图谱。研究了存在于现有相中元素(Al、B、C、N、Ti 和 O)在低损耗和芯损耗能区的光谱特征,并在通过多次线性最小二乘拟合程序提取元素特定键合图谱时使用了这些特征。尽管在束方向上存在相重叠或在 EELS 光谱中存在能量重叠,但仍确定了在所研究区域内元素浓度的变化。此外,还讨论了 Ti(C,N)和 AlN 的表面氧化以及 α-Al(2)O(3)的非晶化。

相似文献

1
A quantitative analysis of a multi-phase polycrystalline cubic boron nitride tool material using DualEELS.使用 DualEELS 对多相多晶立方氮化硼工具材料进行定量分析。
Micron. 2011 Aug;42(6):608-15. doi: 10.1016/j.micron.2011.02.006. Epub 2011 Mar 5.
2
Quantitative electron energy-loss spectroscopy (EELS) analyses of lead zirconate titanate.锆钛酸铅的定量电子能量损失谱(EELS)分析
Micron. 2008 Aug;39(6):709-16. doi: 10.1016/j.micron.2007.10.016. Epub 2007 Oct 22.
3
From electron energy-loss spectroscopy to multi-dimensional and multi-signal electron microscopy.从电子能量损失谱到多维多信号电子显微镜
J Electron Microsc (Tokyo). 2011;60 Suppl 1:S161-71. doi: 10.1093/jmicro/dfr028.
4
Extending the analysis of EELS spectrum-imaging data, from elemental to bond mapping in complex nanostructures.将电子能量损失谱(EELS)光谱成像数据的分析从复杂纳米结构中的元素映射扩展到键映射。
Ultramicroscopy. 2008 Dec;109(1):32-8. doi: 10.1016/j.ultramic.2008.07.005. Epub 2008 Jul 26.
5
New developments in electron energy loss spectroscopy.电子能量损失谱学的新进展。
Microsc Res Tech. 2007 Mar;70(3):211-9. doi: 10.1002/jemt.20407.
6
Development of electron energy-loss spectroscopy for nanoscience.用于纳米科学的电子能量损失谱的发展。
Micron. 2008 Aug;39(6):658-65. doi: 10.1016/j.micron.2007.10.010. Epub 2007 Oct 22.
7
Implementation of Gold deconvolution for enhanced energy resolution in EEL spectra.实现金反卷积以提高 EEL 光谱的能量分辨率。
Ultramicroscopy. 2011 Jan;111(2):79-89. doi: 10.1016/j.ultramic.2010.10.006. Epub 2010 Oct 26.
8
Quantitative nanoscale water mapping in frozen-hydrated skin by low-loss electron energy-loss spectroscopy.利用低损耗电子能量损失谱对冷冻水合皮肤进行定量纳米级水映射。
Ultramicroscopy. 2010 Jun;110(7):866-76. doi: 10.1016/j.ultramic.2010.03.014. Epub 2010 Apr 13.
9
Atomic imaging and spectroscopy of low-dimensional materials with interrupted periodicities.具有间断周期性的低维材料的原子成像与光谱学
J Electron Microsc (Tokyo). 2012;61(5):285-91. doi: 10.1093/jmicro/dfs054. Epub 2012 Jul 18.
10
Dose-limited spectroscopic imaging of soft materials by low-loss EELS in the scanning transmission electron microscope.扫描透射电子显微镜中利用低损耗电子能量损失谱对软材料进行剂量受限的光谱成像。
Micron. 2008 Aug;39(6):734-40. doi: 10.1016/j.micron.2007.10.019. Epub 2007 Oct 22.