Department of Biochemistry and Molecular Biology, University of Oviedo, 33006 Oviedo, Spain.
J Biol Chem. 2011 May 27;286(21):19065-75. doi: 10.1074/jbc.M111.238899. Epub 2011 Apr 7.
Potassium channels encoded by the human ether-à-go-go-related gene (hERG) contribute to cardiac repolarization as a result of their characteristic gating properties. The hERG channel N terminus acts as a crucial determinant in gating. It is also known that the S4-S5 linker couples the voltage-sensing machinery to the channel gate. Moreover, this linker has been repeatedly proposed as an interaction site for the distal portion of the N terminus controlling channel gating, but direct evidence for such an interaction is still lacking. In this study, we used disulfide bond formation between pairs of engineered cysteines to demonstrate the close proximity between the beginning of the N terminus and the S4-S5 linker. Currents from channels with introduced cysteines were rapidly and strongly attenuated by an oxidizing agent, this effect being maximal for cysteine pairs located around amino acids 3 and 542 of the hERG sequence. The state-dependent modification of the double-mutant channels, but not the single-cysteine mutants, and the ability to readily reverse modification with the reducing agent dithiothreitol indicate that a disulfide bond is formed under oxidizing conditions, locking the channels in a non-conducting state. We conclude that physical interactions between the N-terminal-most segment of the N terminus and the S4-S5 linker constitute an essential component of the hERG gating machinery, thus providing a molecular basis for previous data and indicating an important contribution of these cytoplasmic domains in controlling its unusual gating and hence determining its physiological role in setting the electrical behavior of cardiac and other cell types.
人 ether-à-go-go 相关基因 (hERG) 编码的钾通道因其特征性的门控特性而有助于心脏复极。hERG 通道 N 端作为门控的关键决定因素。已知 S4-S5 接头将电压感应机制与通道门偶联。此外,该接头已被反复提出作为控制通道门控的 N 端远端部分的相互作用位点,但仍缺乏直接证据证明这种相互作用。在这项研究中,我们使用两对工程半胱氨酸之间的二硫键形成来证明 N 端起始处与 S4-S5 接头之间的紧密接近。带有引入半胱氨酸的通道电流被氧化剂迅速且强烈地衰减,这种效应对于位于 hERG 序列的氨基酸 3 和 542 附近的半胱氨酸对最大。双突变通道的状态依赖性修饰,但不是单半胱氨酸突变体,以及用还原剂二硫苏糖醇容易逆转修饰的能力表明,在氧化条件下形成二硫键,将通道锁定在非传导状态。我们得出结论,N 端最远端段与 S4-S5 接头之间的物理相互作用构成了 hERG 门控机制的重要组成部分,从而为先前的数据提供了分子基础,并表明这些细胞质结构域在控制其异常门控方面具有重要贡献,从而决定了其在调节心脏和其他细胞类型电行为中的生理作用。