Shi Yu Patrick, Thouta Samrat, Claydon Thomas W
Department of Biomedical Physiology and Kinesiology, Simon Fraser University, Burnaby, BC, Canada.
Front Pharmacol. 2020 Feb 28;11:139. doi: 10.3389/fphar.2020.00139. eCollection 2020.
The hERG (human-ether-à-go-go-related gene) channel underlies the rapid delayed rectifier current, I, in the heart, which is essential for normal cardiac electrical activity and rhythm. Slow deactivation is one of the hallmark features of the unusual gating characteristics of hERG channels, and plays a crucial role in providing a robust current that aids repolarization of the cardiac action potential. As such, there is significant interest in elucidating the underlying mechanistic determinants of slow hERG channel deactivation. Recent work has shown that the hERG channel S4 voltage sensor is stabilized following activation in a process termed relaxation. Voltage sensor relaxation results in energetic separation of the activation and deactivation pathways, producing a hysteresis, which modulates the kinetics of deactivation gating. Despite widespread observation of relaxation behaviour in other voltage-gated K channels, such as , Kv1.2 and Kv3.1, as well as the voltage-sensing phosphatase -VSP, the relationship between stabilization of the activated voltage sensor by the open pore and voltage sensor relaxation in the control of deactivation has only recently begun to be explored. In this review, we discuss present knowledge and questions raised related to the voltage sensor relaxation mechanism in hERG channels and compare structure-function aspects of relaxation with those observed in related ion channels. We focus discussion, in particular, on the mechanism of coupling between voltage sensor relaxation and deactivation gating to highlight the insight that these studies provide into the control of hERG channel deactivation gating during their physiological functioning.
人乙醚去极化相关基因(hERG)通道是心脏中快速延迟整流电流I的基础,这对正常心脏电活动和节律至关重要。缓慢失活是hERG通道异常门控特性的标志性特征之一,在提供有助于心脏动作电位复极化的强大电流方面发挥着关键作用。因此,人们对阐明hERG通道缓慢失活的潜在机制决定因素有着浓厚的兴趣。最近的研究表明,hERG通道的S4电压传感器在激活后通过一个称为松弛的过程得以稳定。电压传感器松弛导致激活和失活途径在能量上分离,产生滞后现象,从而调节失活门控的动力学。尽管在其他电压门控钾通道,如Kv1.2和Kv3.1,以及电压感应磷酸酶-VSP中广泛观察到松弛行为,但开放孔对激活电压传感器的稳定作用与电压传感器松弛在失活控制中的关系直到最近才开始被探索。在这篇综述中,我们讨论了与hERG通道电压传感器松弛机制相关的现有知识和问题,并将松弛的结构-功能方面与在相关离子通道中观察到的情况进行了比较。我们特别关注电压传感器松弛与失活门控之间的耦合机制,以突出这些研究对hERG通道在其生理功能过程中失活门控控制的见解。