Minimizing light reflection from dielectric textured surfaces.

In this paper, we consider antireflective properties of textured surfaces for all texture size-to-wavelength ratios. Existence and location of the global reflection minimum with respect to geometrical parameters of the texture is a subject of our study. We also investigate asymptotic behavior of the reflection with the change of the texture geometry for the long and short wavelength limits. As a particular example, we consider silicon-textured surfaces used in solar cells technology. Most of our results are obtained with the help of the finite-difference time-domain (FDTD) method. We also use effective medium theory and geometric optics approximation for the limiting cases. The FDTD results for these limits are in agreement with the corresponding approximations.