Fabrication and characterization of MIM diodes based on Nb/Nb2O5 via a rapid screening technique.
作者信息
Periasamy Prakash, Berry Joseph J, Dameron Arrelaine A, Bergeson Jeremy D, Ginley David S, O'Hayre Ryan P, Parilla Philip A
机构信息
Department of Metallurgical and Materials Engineering, Colorado School of Mines, Golden, 80401, USA.
出版信息
Adv Mater. 2011 Jul 19;23(27):3080-5. doi: 10.1002/adma.201101115. Epub 2011 May 24.
PMID:21608052
Abstract
摘要
Zotero 插件