Carlie N, Anheier N C, Qiao H A, Bernacki B, Phillips M C, Petit L, Musgraves J D, Richardson K
School of Materials Science and Engineering∕COMSET, Clemson, South Carolina 29640, USA.
Rev Sci Instrum. 2011 May;82(5):053103. doi: 10.1063/1.3587616.
The prism coupling technique has been utilized to measure the refractive index in the near- and mid-IR spectral region of chalcogenide glasses in bulk and thin film form. A commercial system (Metricon model 2010) has been modified with additional laser sources, detectors, and a new GaP prism to allow the measurement of refractive index dispersion over the 1.5-10.6 μm range. The instrumental error was found to be ±0.001 refractive index units across the entire wavelength region examined. Measurements on thermally evaporated AMTIR2 thin films confirmed that (i) the film deposition process provides thin films with reduced index compared to that of the bulk glass used as a target, (ii) annealing of the films increases the refractive index of the film to the level of the bulk glass used as a target to create it, and (iii) it is possible to locally increase the refractive index of the chalcogenide glass using laser exposure at 632.8 nm.
棱镜耦合技术已被用于测量块状和薄膜形式的硫系玻璃在近红外和中红外光谱区域的折射率。对一个商用系统（Metricon 2010型）进行了改进，增加了激光源、探测器和一个新的GaP棱镜，以测量1.5 - 10.6μm范围内的折射率色散。发现在整个检测波长区域内，仪器误差为±0.001折射率单位。对热蒸发的AMTIR2薄膜的测量证实：（i）与用作靶材的块状玻璃相比，薄膜沉积过程得到的薄膜折射率降低；（ii）薄膜退火可使薄膜折射率增加到用作靶材来制备它的块状玻璃的折射率水平；（iii）使用632.8nm激光曝光可以局部增加硫系玻璃的折射率。
