Institute of Microstructure and Properties of Advanced Materials, Beijing University of Technology, Beijing, China.
Nano Lett. 2011 Aug 10;11(8):3151-5. doi: 10.1021/nl201233u. Epub 2011 Jul 22.
Three sets of uniaxial tensile tests have been performed in situ in transmission electron microscopy/high-resolution electron microscopy on Cu nanowires (NWs) to accurately map out the sample size dependence of elastic strain limit. Atomic-resolution evidence was obtained for an exceedingly large recoverable strain (as much as 7.2%) that can be sustained in the lattice of a single-crystalline Cu NW with a diameter of ∼5.8 nm. This ultrahigh elastic strain is consistent with the predictions from molecular dynamics simulations for nanowires and approaches the ideal elastic limit predicted for Cu by ab initio calculations.
已在透射电子显微镜/高分辨率电子显微镜中对铜纳米线(NWs)进行了三组单轴拉伸原位实验,以准确绘制出弹性应变极限的样品尺寸依赖性图。获得了原子分辨率的证据,证明在直径约为 5.8nm 的单晶 Cu NW 晶格中可以持续存在非常大的可恢复应变(高达 7.2%)。这种超高弹性应变与分子动力学模拟对纳米线的预测一致,并接近从头计算预测的 Cu 的理想弹性极限。