Wang Zhong Lin
School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, GA 30332-0245, USA.
J Electron Microsc (Tokyo). 2011;60 Suppl 1:S269-78. doi: 10.1093/jmicro/dfr027.
A future scanning/transmission electron microscope is proposed to be a comprehensive machine that is capable of providing picoseconds time-resolved information at sub-nanometer scale and even at picometer scale, spatial resolution. At the same time, physical and chemical properties can be measured in situ from a region as small as a few nanometers by introducing local electric, mechanical, thermal, magnetic and/or optical stimulations/excitations under vacuum or even in a quasi-ambient environment. It is anticipated that nanoscopy and picoscopy will be key tools for studying picoscale science and developing nanoscale technology related to materials science, biology, physics and chemistry.
一种未来的扫描/透射电子显微镜被设想为一种综合仪器，它能够在亚纳米甚至皮米尺度上提供皮秒级时间分辨信息以及空间分辨率。同时，通过在真空甚至准环境条件下引入局部电、机械、热、磁和/或光刺激/激发，可以在小至几纳米的区域原位测量物理和化学性质。预计纳米显微镜和皮秒显微镜将成为研究皮秒尺度科学以及发展与材料科学、生物学、物理学和化学相关的纳米尺度技术的关键工具。
