Nagpal Rajni, Manuja Naveen, Tyagi Shashi Prabha, Singh Udai Pratap
Department of Conservative Dentistry, Kothiwal Dental College, Moradabad, Uttar Pradesh, India.
J Conserv Dent. 2011 Jul;14(3):258-63. doi: 10.4103/0972-0707.85805.
To evaluate and compare the microleakage of self-etch adhesives placed under different clinical techniques and to analyze the resin-dentin interfacial ultrastructure under scanning electron microscope (SEM).
100 extracted human premolars were divided into two groups for different adhesives (Clearfil S(3) and Xeno III). Class V cavities were prepared. Each group was further divided into four subgroups (n = 10) according to the placement technique of the adhesive, i.e. according to manufacturer's directions (Group 1), with phosphoric acid etching of enamel margins (Group 2), with hydrophobic resin coat application (Group 3), with techniques of both groups 2 and 3 (Group 4). The cavities were restored with composite. Ten samples from each group were subjected to microleakage study. Five samples each of both the adhesives from groups 1 and 3 were used for SEM examination of the micromorphology of the resin-dentin interface.
At enamel margins for both the adhesives tested, groups 2 and 4 showed significantly lesser leakage than groups 1 and 3. At dentin margins, groups 3 and 4 depicted significantly reduced leakage than groups 1 and 2 for Xeno III. SEM observation of the resin-dentin interfaces revealed generalized gap and poor resin tag formation in both the adhesives. Xeno III showed better interfacial adaptation when additional hydrophobic resin coat was applied.
In enamel, prior phosphoric acid etching reduces microleakage of self-etch adhesives, while in dentin, hydrophobic resin coating over one-step self-etch adhesives decreases the microleakage.
评估并比较不同临床技术下自酸蚀粘结剂的微渗漏情况,并在扫描电子显微镜(SEM)下分析树脂-牙本质界面的超微结构。
将100颗拔除的人类前磨牙分为两组,分别使用不同的粘结剂(Clearfil S(3)和Xeno III)。制备V类洞。根据粘结剂的涂布技术,每组进一步分为四个亚组(n = 10),即按照制造商说明(第1组)、对釉质边缘进行磷酸酸蚀(第2组)、应用疏水树脂涂层(第3组)、同时采用第2组和第3组技术(第4组)。用复合树脂修复窝洞。每组取10个样本进行微渗漏研究。第1组和第3组每种粘结剂各取5个样本用于SEM检查树脂-牙本质界面的微观形态。
对于所测试的两种粘结剂,在釉质边缘,第2组和第4组的渗漏明显少于第1组和第3组。在牙本质边缘,对于Xeno III,第3组和第4组的渗漏比第1组和第2组明显减少。对树脂-牙本质界面的SEM观察显示,两种粘结剂均存在普遍的间隙和树脂突形成不良的情况。应用额外的疏水树脂涂层时,Xeno III显示出更好的界面适应性。
在釉质中,预先进行磷酸酸蚀可减少自酸蚀粘结剂的微渗漏,而在牙本质中,对一步法自酸蚀粘结剂应用疏水树脂涂层可减少微渗漏。