Otto Kevin, Williams Justin
Department of Biological Sciences and Weldon School of Biomedical Engineering, Purdue University, West Lafayette, Indiana, USA.
IEEE Pulse. 2012 Jan;3(1):27-9. doi: 10.1109/MPUL.2011.2175631.
Neural implantation of devices and the subsequent tissue response are complex and cascading physical and biological phenomena. Creation of reliable neural interfaces remains a significant challenge. Penetrating central nervous system interfaces persist as the most challenging to realize but continue to be the most attractive because of the information bandwidth advantages they provide. This rich information source is essential for achieving next-generation prosthetic control. Specific challenges of penetrating central nervous system interfaces arise because of the reactive tissue response to the initial injury due to device insertion as well as the continued response due to device indwelling. These responses consist of biochemical signaling events, microglial activation, and astrogliotic cell reorganization that result in biophysical changes of the tissue near the implanted device and finally, electrophysiological neural cell/signal loss (Figure 1). The ultimate realization of reliable penetrating neural interfaces will require careful science and engineering approaches incorporating knowledge of relevant and critical biological, physical, and chemical factors, especially their interrelationship. In this article, we describe a comprehensive strategy to assess the reliability of penetrating central neural interfaces based on the biology and pathology of the injury and indwelling tissue responses. Our strategy involves a parallel, self-informing approach by simultaneous development of new in vitro and in vivo assessment techniques as well as using these state-of-the-art techniques to conduct accelerated lifetime assessments of neural interface degradation.
将设备植入神经以及随后的组织反应是复杂且具有级联效应的物理和生物学现象。创建可靠的神经接口仍然是一项重大挑战。穿透性中枢神经系统接口仍然是最难实现的,但由于其提供的信息带宽优势,仍然最具吸引力。这种丰富的信息源对于实现下一代假肢控制至关重要。穿透性中枢神经系统接口面临的特定挑战源于组织对设备插入造成的初始损伤的反应以及由于设备留置而持续的反应。这些反应包括生化信号事件、小胶质细胞激活和星形胶质细胞重组,这些会导致植入设备附近组织的生物物理变化,最终导致电生理神经细胞/信号损失(图1)。可靠的穿透性神经接口的最终实现将需要谨慎的科学和工程方法,结合相关关键生物学、物理和化学因素的知识,尤其是它们之间的相互关系。在本文中,我们描述了一种基于损伤生物学和病理学以及留置组织反应来评估穿透性中枢神经接口可靠性的综合策略。我们的策略涉及一种并行的、自我反馈的方法,即同时开发新的体外和体内评估技术,并使用这些先进技术对神经接口退化进行加速寿命评估。