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基于 Zn2SnO4 纳米线的高性能双极阻变存储器件。

High performance bipolar resistive switching memory devices based on Zn2SnO4 nanowires.

机构信息

Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China.

出版信息

Nanoscale. 2012 Apr 21;4(8):2571-4. doi: 10.1039/c2nr30133d. Epub 2012 Mar 14.

Abstract

The resistive switching behavior of metal-oxide-metal nanoscale devices is a fascinating phenomenon of next generation nonvolatile memories. Here, we demonstrate nanoscale memristive devices based on Zn(2)SnO(4) nanowires (ZTO NWs) for the first time. The devices show high performance bipolar resistive switching behaviors, including an ultrafast response speed of 20 ns, a low operation voltage of <2 V and long data retention (over 5 months). A physical model of metal filament formation along the ZTO NWs has been suggested to explain the bipolar resistive switching behavior.

摘要

金属-氧化物-金属纳米器件的电阻开关行为是下一代非易失性存储器中一个引人入胜的现象。在这里,我们首次展示了基于 Zn(2)SnO(4)纳米线(ZTO NWs)的纳米级忆阻器件。该器件表现出优异的双极性电阻开关性能,包括 20ns 的超快响应速度、<2V 的低工作电压和超长的数据保持时间(超过 5 个月)。提出了一种沿 ZTO NWs 形成金属丝的物理模型来解释双极性电阻开关行为。

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