Department of Chemistry and Center for Innovation in Chemistry, Faculty of Science, Mahidol University, Rama VI Rd., Bangkok 10400, Thailand.
Anal Chem. 2012 Jun 5;84(11):4993-8. doi: 10.1021/ac300662b. Epub 2012 May 14.
The potential of electrical field-flow fractionation (ElFFF) for characterization of metal nanoparticles was investigated in this study. Parameters affecting separation and retention such as applied DC voltage and flow rate were examined. Nanoparticles with different types of stabilizers, including citrate and tannic acid, were investigated. Changes to the applied voltage showed a significant influence on separation in ElFFF, and varying flow rate was used to improve plate heights in the experiments. For nanoparticles of a fixed size, the separation was based primarily on electrophoretic mobility. Particles with low electrophoretic mobility elute earlier. Therefore, citrate stabilized gold nanoparticles (-2.72 × 10(-4) cm(2) V(-1) s(-1)) eluted earlier than tannic acid stabilized gold nanoparticles (-4.54 × 10(-4) cm(2) V(-1) s(-1)) of the same size. In addition, ElFFF can be used for characterization of gold nanoparticles with different particle sizes including 10, 20, and 40 nm with a fixed stabilizing agent. For a specific separation condition, the separation of 10, 20, and 40 nm gold nanoparticles was clearly based on the particle size as opposed to the electrophoretic mobility, as the elution order was in order of decreasing mobility for 10 (-4.54 × 10(-4) cm(2) V(-1) s(-1)), 20 (-3.97 × 10(-4) cm(2) V(-1) s(-1)), and 40 (-3.76 × 10(-4) cm(2) V(-1) s(-1)) nm particles, respectively.
本研究考察了电场流场分级（ElFFF）在金属纳米粒子特性描述方面的潜力。考察了影响分离和保留的参数，如施加的直流电压和流速。研究了具有不同稳定剂（包括柠檬酸和单宁酸）的纳米粒子。施加电压的变化对 ElFFF 中的分离有显著影响，而流速的变化则用于改善实验中的板高。对于固定尺寸的纳米粒子，分离主要基于电泳迁移率。电泳迁移率低的粒子先洗脱。因此，具有相同尺寸的柠檬酸稳定的金纳米粒子（-2.72×10(-4)cm(2)V(-1)s(-1)）比单宁酸稳定的金纳米粒子（-4.54×10(-4)cm(2)V(-1)s(-1)）更早洗脱。此外，ElFFF 可用于表征具有不同粒径（包括 10、20 和 40nm）的金纳米粒子，而固定稳定剂。对于特定的分离条件，10、20 和 40nm 金纳米粒子的分离显然基于粒径而不是电泳迁移率，因为洗脱顺序是根据 10nm（-4.54×10(-4)cm(2)V(-1)s(-1)）、20nm（-3.97×10(-4)cm(2)V(-1)s(-1)）和 40nm（-3.76×10(-4)cm(2)V(-1)s(-1)）纳米粒子的迁移率依次降低。
