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不同手握力下前臂表面肌电的日内和日内可靠性。

Intra-session and inter-day reliability of forearm surface EMG during varying hand grip forces.

机构信息

School of Physiotherapy, University of Otago, New Zealand.

出版信息

J Electromyogr Kinesiol. 2013 Feb;23(1):216-22. doi: 10.1016/j.jelekin.2012.08.011. Epub 2012 Sep 19.

Abstract

Surface electromyography (EMG) is widely used to evaluate forearm muscle function and predict hand grip forces; however, there is a lack of literature on its intra-session and inter-day reliability. The aim of this study was to determine reliability of surface EMG of finger and wrist flexor muscles across varying grip forces. Surface EMG was measured from six forearm flexor muscles of 23 healthy adults. Eleven of these subjects undertook inter-day test-retest. Six repetitions of five randomized isometric grip forces between 0% and 80% of maximum force (MVC) were recorded and normalized to MVC. Intra- and inter-day reliability were calculated through the intraclass correlation coefficient (ICC) and standard error of measurement (SEM). Normalized EMG produced excellent intra-session ICC of 0.90 when repeated measurements were averaged. Intra-session SEM was low at low grip forces, however, corresponding normalized SEM was high (23-45%) due to the small magnitude of EMG signals. This may limit the ability to evaluate finer forearm muscle function and hand grip forces in daily tasks. Combining EMG of functionally related muscles improved intra-session SEM, improving within-subject reliability without taking multiple measurements. Removing and replacing electrodes inter-day produced poor ICC (ICC < 0.50) but did not substantially affect SEM.

摘要

表面肌电图(EMG)广泛用于评估前臂肌肉功能和预测手握力;然而,关于其会话内和日内可靠性的文献较少。本研究旨在确定在不同握力下,手指和腕部屈肌的表面 EMG 的可靠性。从 23 名健康成年人的 6 块前臂屈肌中测量表面 EMG。其中 11 名参与者进行了日内测试-再测试。记录了在 0%至 80%最大握力(MVC)之间的 5 种随机等长握力的 6 次重复,并归一化为 MVC。通过组内相关系数(ICC)和测量标准误差(SEM)计算了日内和日内可靠性。当重复测量平均值时,产生了极好的会话内 ICC(0.90)。然而,由于 EMG 信号幅度较小,低握力时的会话内 SEM 较低,但相应的归一化 SEM 较高(23-45%)。这可能限制了在日常任务中评估更精细的前臂肌肉功能和手握力的能力。结合功能相关肌肉的 EMG 可提高会话内 SEM,提高个体内可靠性,而无需进行多次测量。日内移除和更换电极会产生较差的 ICC(ICC <0.50),但不会显著影响 SEM。

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