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边界层扩散在硫属化物纳米片的气相沉积生长中的作用:以 GeS 为例。

Role of boundary layer diffusion in vapor deposition growth of chalcogenide nanosheets: the case of GeS.

机构信息

Department of Materials Science and Engineering, North Carolina State University, Raleigh, North Carolina 27695, USA.

出版信息

ACS Nano. 2012 Oct 23;6(10):8868-77. doi: 10.1021/nn303745e. Epub 2012 Oct 4.

Abstract

We report a synthesis of single-crystalline two-dimensional GeS nanosheets using vapor deposition processes and show that the growth behavior of the nanosheet is substantially different from those of other nanomaterials and thin films grown by vapor depositions. The nanosheet growth is subject to strong influences of the diffusion of source materials through the boundary layer of gas flows. This boundary layer diffusion is found to be the rate-determining step of the growth under typical experimental conditions, evidenced by a substantial dependence of the nanosheet's size on diffusion fluxes. We also find that high-quality GeS nanosheets can grow only in the diffusion-limited regime, as the crystalline quality substantially deteriorates when the rate-determining step is changed away from the boundary layer diffusion. We establish a simple model to analyze the diffusion dynamics in experiments. Our analysis uncovers an intuitive correlation of diffusion flux with the partial pressure of source materials, the flow rate of carrier gas, and the total pressure in the synthetic setup. The observed significant role of boundary layer diffusions in the growth is unique for nanosheets. It may be correlated with the high growth rate of GeS nanosheets, ~3-5 μm/min, which is 1 order of magnitude higher than other nanomaterials (such as nanowires) and thin films. This fundamental understanding of the effect of boundary layer diffusions may generally apply to other chalcogenide nanosheets that can grow rapidly. It can provide useful guidance for the development of general paradigms to control the synthesis of nanosheets.

摘要

我们报告了一种使用气相沉积工艺合成单晶二维 GeS 纳米片的方法,并表明纳米片的生长行为与其他通过气相沉积生长的纳米材料和薄膜有很大的不同。纳米片的生长受到源材料通过气流边界层扩散的强烈影响。在典型的实验条件下,边界层扩散被发现是生长的速率决定步骤,这一点可以通过纳米片尺寸对扩散通量的显著依赖得到证明。我们还发现,高质量的 GeS 纳米片只能在扩散限制的条件下生长,因为当速率决定步骤从边界层扩散改变时,晶体质量会大大恶化。我们建立了一个简单的模型来分析实验中的扩散动力学。我们的分析揭示了扩散通量与源材料分压、载气流速以及合成装置总压之间的直观相关性。在生长过程中观察到的边界层扩散的显著作用对于纳米片来说是独特的。它可能与 GeS 纳米片的高生长速率(~3-5μm/min)有关,这比其他纳米材料(如纳米线)和薄膜高一个数量级。对边界层扩散影响的这种基本理解可能普遍适用于其他能够快速生长的硫属化物纳米片。它可以为控制纳米片合成的通用范例的发展提供有用的指导。

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