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带有铝纳米线偏振滤光片的集成光谱偏振成像传感器。

Integrated spectral-polarization imaging sensor with aluminum nanowire polarization filters.

作者信息

Kulkarni Meenal, Gruev Viktor

机构信息

Department of Computer Science and Engineering, Washington University in Saint Louis, One Brookings Drive, Saint Louis, Missouri 63130, USA.

出版信息

Opt Express. 2012 Oct 8;20(21):22997-3012. doi: 10.1364/OE.20.022997.

Abstract

Current division-of-focal-plane polarization imaging sensors can perceive intensity and polarization in real time with high spatial resolution, but are oblivious to spectral information. We present the design of such a sensor, which is also spectrally selective in the visible regime. We describe its extensive spectral and polarimetric characterization. The sensor has a pixel pitch of 5 µm and an imaging array of 168 by 256 elements. Each element comprises spectrally sensitive vertically stacked photodetectors integrated with a 140 nm pitch nanowire linear polarizer. The sensor has a maximum measured SNR of 45 dB, extinction ratio of ~3.5, QE of 12%, and linearity error of 1% in the green channel. We present sample spectral-polarization images.

摘要

当前的焦平面偏振成像传感器能够以高空间分辨率实时感知强度和偏振,但却忽略了光谱信息。我们展示了一种这样的传感器的设计,它在可见光波段也是光谱选择性的。我们描述了其广泛的光谱和偏振特性。该传感器的像素间距为5微米,成像阵列由168×256个元件组成。每个元件包括与间距为140纳米的纳米线线性偏振器集成的光谱敏感垂直堆叠光电探测器。该传感器在绿色通道中的最大测量信噪比为45分贝,消光比约为3.5,量子效率为12%,线性误差为1%。我们展示了样本光谱偏振图像。

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