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基于物理的单轴多晶硅 MEMS 加速度计的降阶建模。

Physically-based reduced order modelling of a uni-axial polysilicon MEMS accelerometer.

机构信息

Dipartimento di Ingegneria Strutturale, Politecnico di Milano, Piazza Leonardo da Vinci 32, 20133 Milano, Italy.

出版信息

Sensors (Basel). 2012 Oct 17;12(10):13985-4003. doi: 10.3390/s121013985.

DOI:10.3390/s121013985
PMID:23202031
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC3545602/
Abstract

In this paper, the mechanical response of a commercial off-the-shelf, uni-axial polysilicon MEMS accelerometer subject to drops is numerically investigated. To speed up the calculations, a simplified physically-based (beams and plate), two degrees of freedom model of the movable parts of the sensor is adopted. The capability and the accuracy of the model are assessed against three-dimensional finite element simulations, and against outcomes of experiments on instrumented samples. It is shown that the reduced order model provides accurate outcomes as for the system dynamics. To also get rather accurate results in terms of stress fields within regions that are prone to fail upon high-g shocks, a correction factor is proposed by accounting for the local stress amplification induced by re-entrant corners.

摘要

本文数值研究了商业现货、单轴多晶硅微机电系统加速度计在跌落情况下的力学响应。为了加快计算速度,采用了简化的基于物理的(梁和板)、传感器可动部件的两自由度模型。该模型的能力和准确性通过三维有限元模拟和仪器化样品的实验结果进行了评估。结果表明,该降阶模型在系统动力学方面提供了准确的结果。为了在高冲击加速度下容易失效的区域内获得相当准确的应力场结果,通过考虑凹角引起的局部应力放大,提出了一个修正因子。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fc09/3545602/a3f7457b5598/sensors-12-13985f11.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fc09/3545602/319093b3e2d8/sensors-12-13985f1.jpg
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https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fc09/3545602/932644f3e4d4/sensors-12-13985f3.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fc09/3545602/d60f448ff942/sensors-12-13985f4.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fc09/3545602/29b2f39aea3b/sensors-12-13985f5.jpg
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https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fc09/3545602/09ae988ed231/sensors-12-13985f9.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fc09/3545602/bc437fe0d63e/sensors-12-13985f10.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fc09/3545602/a3f7457b5598/sensors-12-13985f11.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fc09/3545602/319093b3e2d8/sensors-12-13985f1.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fc09/3545602/5902af2d191c/sensors-12-13985f2.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fc09/3545602/932644f3e4d4/sensors-12-13985f3.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fc09/3545602/d60f448ff942/sensors-12-13985f4.jpg
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https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fc09/3545602/4c7fe1696bb2/sensors-12-13985f6.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fc09/3545602/fd91d20aa6c5/sensors-12-13985f7.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fc09/3545602/ffea1b448a93/sensors-12-13985f8.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fc09/3545602/09ae988ed231/sensors-12-13985f9.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fc09/3545602/bc437fe0d63e/sensors-12-13985f10.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fc09/3545602/a3f7457b5598/sensors-12-13985f11.jpg

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本文引用的文献

1
Multi-scale Analysis of MEMS Sensors Subject to Drop Impacts.受跌落冲击的微机电系统传感器的多尺度分析
Sensors (Basel). 2007 Sep 7;7(9):1817-1833. doi: 10.3390/s7081817.
2
Effects of van der Waals Force and Thermal Stresses on Pull-in Instability of Clamped Rectangular Microplates.范德华力和热应力对矩形夹支微板拉入失稳的影响。
Sensors (Basel). 2008 Feb 15;8(2):1048-1069. doi: 10.3390/s8021048.
3
Modeling Impact-induced Failure of Polysilicon MEMS: A Multi-scale Approach.多尺度方法建模聚硅 MEMS 的冲击失效。
Sensors (Basel). 2009;9(1):556-67. doi: 10.3390/s90100556. Epub 2009 Jan 19.
4
Two-scale simulation of drop-induced failure of polysilicon MEMS sensors.多晶硅 MEMS 传感器的液滴致损的两尺度模拟
Sensors (Basel). 2011;11(5):4972-89. doi: 10.3390/s110504972. Epub 2011 May 4.