Institut für Laser- und Plasmaphysik, Heinrich-Heine-Universität Düsseldorf, Düsseldorf 40225, Germany.
Opt Lett. 2013 May 1;38(9):1563-5. doi: 10.1364/OL.38.001563.
We demonstrate the feasibility of measuring x-ray refractive indices by transparent edge diffraction without recourse to the Kramers-Kronig relations. The method requires a coherent x-ray source, a transparent sample with a straight edge, and a high resolution x-ray detector. Here, we use the aluminum Kα radiation originating from a laser-produced plasma to coherently illuminate the edge of thin aluminum and beryllium foils. The resulting diffraction patterns are recorded with an x-ray CCD camera. From least-squares fits of Fresnel diffraction modeling to the measured data we determine the refractive index of Al and Be at the wavelength of the Al Kα radiation (0.834 nm, 1.49 keV).
我们证明了一种无需借助克喇末-克龙尼克关系即可通过透明边缘衍射测量 X 射线折射率的可行性。该方法需要相干 X 射线源、具有直边的透明样品和高分辨率 X 射线探测器。在这里，我们使用源自激光产生等离子体的铝 Kα 辐射来相干地照亮薄铝和铍箔的边缘。用 X 射线 CCD 相机记录得到的衍射图案。通过对测量数据进行最小二乘拟合菲涅耳衍射模型，我们确定了 Al 和 Be 在 Al Kα 辐射波长（0.834nm，1.49keV）处的折射率。
