Department of Physical Electronics, Tokyo Institute of Technology, Meguro-ku, Tokyo 152-8552, Japan.
Nanoscale Res Lett. 2013 May 7;8(1):216. doi: 10.1186/1556-276X-8-216.
Silicon nanowire (SiNW) arrays were prepared on silicon substrates by metal-assisted chemical etching and peeled from the substrates, and their optical properties were measured. The absorption coefficient of the SiNW arrays was higher than that for the bulk silicon over the entire region. The absorption coefficient of a SiNW array composed of 10-μm-long nanowires was much higher than the theoretical absorptance of a 10-μm-thick flat Si wafer, suggesting that SiNW arrays exhibit strong optical confinement. To reveal the reason for this strong optical confinement demonstrated by SiNW arrays, angular distribution functions of their transmittance were experimentally determined. The results suggest that Mie-related scattering plays a significant role in the strong optical confinement of SiNW arrays.
硅纳米线(SiNW)阵列通过金属辅助化学刻蚀在硅衬底上制备,并从衬底上剥离,然后测量其光学性质。在整个区域内,SiNW 阵列的吸收系数都高于体硅的吸收系数。由 10μm 长纳米线组成的 SiNW 阵列的吸收系数远高于 10μm 厚的平硅片的理论吸收率,表明 SiNW 阵列表现出强的光学限制。为了揭示 SiNW 阵列表现出的这种强光学限制的原因,实验确定了它们透过率的角分布函数。结果表明,Mie 相关散射在 SiNW 阵列的强光学限制中起着重要作用。