Universidade Federal de Minas Gerais, Instituto de Ciências Exatas, Departamento de Física, Belo Horizonte/MG, 31720-901, Brazil.
Nanoscale. 2013 Jul 21;5(14):6439-44. doi: 10.1039/c3nr01300f. Epub 2013 Jun 6.
The electrical observation of energy sub-band formation in the electronic structure, that gives rise to the phenomenon of quantized transport is reported in tin oxide (SnO2) nanobelt back-gate field-effect transistors, at low temperatures. Sub-band formation was observed as current oscillations in the drain current vs. gate voltage characteristics, and was analyzed considering the nanobelt as a "quantum wire" with a rectangular cross-section and hard walls. The lateral quantum confinement in the nanowires created conditions for the successive filling of the first twelve electron energy sub-bands, as the gate voltage increases. When the source-drain voltage is changed, the oscillations are not dislocated with respect to the gate voltage indicating flat-band energies, and that the observations are incompatible with the phenomena of Coulomb blockade and tunnelling oscillations. The separation of the energy sub-bands was found to be in good agreement with the measured cross-section dimensions of the nanobelt and with the threshold temperature, since for T > 60 K the oscillations tend to vanish.
在低温下,通过对锡氧化物(SnO2)纳米带背栅场效应晶体管的电子结构进行能量子带形成的电观测,发现了导致量子输运现象的原因。子带形成表现为漏极电流与栅极电压特性中的电流振荡,并通过将纳米带视为具有矩形横截面和硬壁的“量子线”进行分析。纳米线中的横向量子限制为栅极电压增加时连续填充前十二个电子能带子带创造了条件。当源极-漏极电压变化时,振荡相对于栅极电压没有错位,表明平带能量,并且观察结果与库仑阻塞和隧道振荡现象不兼容。子带能量的分离与纳米带的测量横截面尺寸和阈值温度非常吻合,因为在 T > 60 K 时,振荡趋于消失。